3D ESD verification: Tackling new challenges in advanced IC design

3D ESD verification: Tackling new challenges in advanced IC design
by Admin on 12-17-2025 at 10:00 am

fig1 3d structures

By Dina Medhat

Three key takeaways

  • 3D ICs require fundamentally new ESD verification strategies. Traditional 2D approaches cannot address the complexity and unique connections in stacked-die architectures.
  • Classifying external and internal IOs is essential for robust and cost-efficient ESD protection. Proper differentiation
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Visualizing hidden parasitic effects in advanced IC design 

Visualizing hidden parasitic effects in advanced IC design 
by Admin on 10-15-2025 at 10:00 am

[white paper] Parasitic Analysis Figures

By Omar Elabd

As semiconductor designs move below 7 nm, parasitic effects—resistance, capacitance and inductance—become major threats to IC performance and reliability, often hiding where netlist reviews cannot reach. Design teams need advanced visualization tools like heat maps, layer-based analysis and direct layout… Read More