ABOUT PAINE Physical inspection of electronics has grown significantly over the past decade and is becoming a major focus for the chip designers, original equipment manufacturers, and system developers. The …
The IEEE/ACM International Symposium on Microarchitecture® is the premier forum for presenting, discussing, and debating innovative microarchitecture ideas and techniques for advanced computing and communication systems. This symposium brings together researchers in …
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The 2025 International Conference on Computer-Aided Design Call For Papers Jointly sponsored by IEEE and ACM, IEEE ICCAD is the premier forum to explore new challenges, present leading-edge innovative solutions, and identify emerging technologies in the electronic design automation research areas. IEEE ICCAD covers the full range of CAD topics – from device and circuit …
100 YEARS of FETs: SHAPING the FUTURE of DEVICE INNOVATIONS Inside IEEE IEDM 2025 Focus Sessions Focus Session #1 - Efficient AI Solutions: Architecture, Circuit, and 3D Integration Innovations for Memory and Logic Focus Session #2 - Beyond Silicon: The Invisible Revolution in Thin-Film Transistors Focus Session #3 - From P-bits to Qubits: Classical, Quantum-Inspired …
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