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Webinar: Accelerate time to success using smart methods for DFT chip architecture and validation
Webinar: Accelerate time to success using smart methods for DFT chip architecture and validation
Combining market-leading design-for-test (DFT) technologies with best-in-class netlist synthesis allows you to achieve DFT success more quickly. Many customers, including those for emulation and IC test, have challenges with scaling architectures. This webinar describes how Siemens emulation and silicon test solutions can work together to provide a smart DFT plug-and-play architecture for Veloce ICs. The …
