From Theory to Practice: Applying Timing Constraints Workshop Do you struggle to identify which constraints are needed for a design or how to properly input them? This workshop will cover how to use features in Vivado, clock domain crossing strategies, and how to get the most out of static timing analysis for Versal devices. This …
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Date: Nov. 20, 2025 Time: SIA Reception at 5:00 pm Dinner, Awards Presentations, & Keynote Remarks at 6:30 pm After-Dinner Reception at 8:30 pm Location: Signia by Hilton San Jose 170 S Market St San Jose, Calif.95113 PRIORITY SPONSORSHIP PERIOD NOW OPEN! The 2025 SIA Awards Dinner Priority Sponsorship Period is now open! Only Gold …
Join us for the 2025 TSMC OIP ECOSYSTEM FORUM Get ready for an electrifying dive into the future of semiconductor design at the 2025 TSMC Global Open Innovation Platform® (OIP) Ecosystem Forum! This isn’t just an event; it’s a dynamic hub where the brightest minds converge to ignite the next wave of innovation. As the AI …
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Description Clock domain crossings (CDCs) are a critical aspect of FPGA and embedded system design, and handling them correctly is essential for reliable operation. In this one-hour webinar, we’ll break down CDC fundamentals, explore best practices for managing single-bit and bus CDCs, and demonstrate how to leverage Xilinx Parameterized Macros (XPM) for seamless synchronization. Join …
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Speaker: Hong-Cheang Quek, AE Director 10:00am~11:00am iPegasus Verification System for Virtuoso Studio 11:00am~11:15am Q&A Description: Today's complex SoC designs significantly increase layout creation and verification time, especially at advanced nodes. To meet overall demand for faster design cycle turnaround time, bridge a demand gap, and improve productivity between custom implementation and physical verification tools, Cadence …
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Join us for the 2025 TSMC OIP ECOSYSTEM FORUM Get ready for an electrifying dive into the future of semiconductor design at the 2025 TSMC Global Open Innovation Platform® (OIP) Ecosystem Forum! This isn’t just an event; it’s a dynamic hub where the brightest minds converge to ignite the next wave of innovation. As the AI …
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100 YEARS of FETs: SHAPING the FUTURE of DEVICE INNOVATIONS Inside IEEE IEDM 2025 Focus Sessions Focus Session #1 - Efficient AI Solutions: Architecture, Circuit, and 3D Integration Innovations for Memory and Logic Focus Session #2 - Beyond Silicon: The Invisible Revolution in Thin-Film Transistors Focus Session #3 - From P-bits to Qubits: Classical, Quantum-Inspired …
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Speaker: Kee Tat Ong, Principal Application Engineer 10:00am~11:00am Quantus Insight: Intelligent Parasitic Debugging, Optimization, and Signoff Closure 11:00am~11:15am Q&A Description: With more designs migrating to advanced process nodes, chips are getting smaller, but design complexity is increasing in order to deliver better power, performance, or area. These optimizations are restricted by the time window to …
Essential Debugging Techniques Workshop This workshop is for hardware engineers, system architects, and anyone who wants to learn best practices for debugging challenging issues encountered while developing FPGAs, SoCs, PCBs, and embedded systems using the Vivado Design Suite. The features and capabilities of the Vivado Integrated Logic Analyzer are covered in lectures and demonstrations, along with …
Semiconductor and integrated circuit developments continue to proceed at an incredible pace. For example, today's application-specific ICs and microprocessors can contain upwards of 100 million transistors. Traditional testing relies on the stuck-at-fault (SAF) to model defect behavior. Unfortunately, the SAF model is a poor model for defects. Other models and strategies are required to catch …
Semiconductor and integrated circuit developments continue to proceed at an incredible pace. The industry as a whole has gotten to this point of incredible complexity through the process of countless breakthroughs and developments in wafer fab processing. Today's wafer fab contains some of the most complex and intricate procedures ever developed by mankind. Wafer Fab Processing is …
Failure and Yield Analysis is an increasingly difficult and complex process. Today, engineers are required to locate defects on complex integrated circuits. In many ways, this is akin to locating a needle in a haystack, where the needles get smaller and the haystack gets bigger every year. Engineers are required to understand a variety of …
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