Electron Beam Probing: The New Sheriff in Town for Security Analyzing of Sub- 7nm ICs with Backside PDN

Electron Beam Probing: The New Sheriff in Town for Security Analyzing of Sub- 7nm ICs with Backside PDN
by Nitin Varshney on 10-15-2024 at 10:00 am

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The outsourcing fabrication of ICs makes them vulnerable to hardware security threats. Security threats such as reverse engineering, insertion of hardware Trojan, and backside contact-less probing to steal cryptographic information can cause financial loss to IP owners and security risk to the system in which these ICs are… Read More