The Pain of Test Pattern Bring-up for First Silicon Debug

The Pain of Test Pattern Bring-up for First Silicon Debug
by Daniel Payne on 08-22-2018 at 7:00 am

In the semiconductor world we have divided our engineering talent up into many adjacent disciplines and each comes with their own job titles: Design engineers, Verification engineers, DFT engineers, Test engineers. When first silicon becomes available then everyone on the team, and especially management all have a few big … Read More