Use Existing High Speed Interfaces for Silicon Test

Use Existing High Speed Interfaces for Silicon Test
by Tom Simon on 03-14-2022 at 6:00 am

High Speed Test Access

The growth of complexity for silicon test as it relates to test data volume and test times is driven by multiple concurrent factors. One dimension is simply the increase in silicon complexity. However, other factors are playing a role as well. These include higher reliability requirements for new applications such as automotive,… Read More