Synopsys’ 30th Annual Test & SLM Special Interest Group (SIG) & International Test Conference (ITC)

Synopsys’ 30th Annual Test & SLM Special Interest Group (SIG) & International Test Conference (ITC)
by Admin on 11-04-2024 at 3:22 am

All members of the design and test community are invited to register to attend Synopsys’ 30th Annual Test & SLM Special Interest Group (SIG) at the 2024 International Test Conference (ITC).

The event will host experts from leading companies who will share how Synopsys Test and SLM solutions including AI-driven test, distributed… Read More


Modeling TSV, IBIS-AMI and SERDES with HSPICE

Modeling TSV, IBIS-AMI and SERDES with HSPICE
by Daniel Payne on 02-21-2013 at 8:10 pm

The HSPICE circuit simulator has been around for decades and is widely used by IC designers worldwide, so I watched the HSPICE SIG by video today and summarize what happened. Engineers from Micron, Altera and AMD presented on how they are using HSPICE to model TSVs, IBiS-AMI models and SERDES, respectively.… Read More