CadenceTECHTALK: Preventing EM Failures in IC Designs with Signoff Analysis
Date: Tuesday, September 20, 2022
Time: 10:00 – 11:00 (CEST)
Electromigration (EM) impacts design reliability, causing failures over time. That is why it’s important to analyze both the power mesh and signal wires to check that the average, rms, or peak currents will not lead to a permanent failure. Learn how the Cadence