How Allegro MicroSystems Increased OEE by Several Percentage Points with yieldHUB Live

How Allegro MicroSystems Increased OEE by Several Percentage Points with yieldHUB Live
by Daniel Nenni on 11-03-2026 at 6:00 am

How Allegro MicroSystems Increased OEE by Several Percentage Points with yieldHUB Live

Allegro MicroSystems’ experience with yieldHUB Live shows how better use of production data can translate into measurable manufacturing gains. At its high-volume semiconductor operation in the Philippines, Allegro set out to improve overall equipment effectiveness, or OEE, by one percentage point. According to the customer… Read More


Beyond the Post-Mortem: How yieldHUB Live Turns the Test Floor Into an Open Window

Beyond the Post-Mortem: How yieldHUB Live Turns the Test Floor Into an Open Window
by Lauro Rizzatti on 10-21-2026 at 10:00 am

Live visibility on the semiconductor test floor (1)

At SEMICON West 2026 I sat down with John O’Donnell, founder and CEO, and Gillian O’Donnell, Director of Growth, to talk about how yieldHUB Live is transforming the semiconductor test floor from a blind spot into a real-time command center.

For decades, semiconductor test floors have operated as high-stakes black… Read More