Webinar: Fast and Accurate High-Sigma Analysis with Worst-Case Points

Webinar: Fast and Accurate High-Sigma Analysis with Worst-Case Points
by Admin on 10-31-2023 at 3:42 pm

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Advanced semiconductor nanometer technology nodes, together with smart IC design applications enable today very complex and powerful systems for communication, automotive, data transmission, AI, IoT, medical, industry, energy harvesting, and many more. Random variation in … Read More


White Paper – Mixed Signal Verification for Nanometer SOCs

White Paper – Mixed Signal Verification for Nanometer SOCs
by Tom Simon on 08-19-2020 at 10:00 am

Mixed signal SOCs

The number of touchpoints between analog and digital circuits in high performance SoCs is increasing. This is not a problem because it is possible to implement critical analog blocks directly on nanometer scale digital ICs. However, in many cases digital interfaces or digital feedback circuitry configures these analog blocks… Read More


Challenges in IP Qualification with Rising Physical Data

Challenges in IP Qualification with Rising Physical Data
by Pawan Fangaria on 12-17-2015 at 7:00 am

With every new technology node, there are newer physical effects that need to be taken into account. And every new physical effect brings with itself several new formats to model them. Often a format is also associated with several of its derivatives, sometimes an standard reincarnation of a proprietary format further evolved… Read More