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Layout-aware Diagnosisby Paul McLellan on 08-08-2014 at 8:01 amCategories: EDA
Traditional test methodologies have been based on the functional model, that is to say the netlist. The most well-known is probably the stuck-at model which grades a sequence of test vectors by whether they would have managed to notice the difference between a fully functional design and one where one of the signals was permanently… Read More