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Test and Diagnosis at ISTFAby Beth Martin on 11-15-2012 at 7:10 pmCategories: EDA, Siemens EDA
Finding and debugging failures on integrated circuits has become increasingly difficult. Two sessions at ISTFA (International Symposium for Testing and Failure Analysis) on Thursday address the current best practices and research directions of diagnosis.
The first was a tutorial this morning by Mentor Graphics luminary… Read More
