Software is at the core of digital transformation, enabling you to create value for your customers in new, innovative ways. However, software introduces business risks that need to be managed proactively and at the same velocity as the software development itself. This places new demands on software
About SNUG Europe
Since 1991, the Synopsys Users Group (SNUG) has represented a global design community focused on innovating from Silicon to Software. Today, as the electronics industry’s largest user conference, SNUG brings together over 12,000 Synopsys tool and technology users around the world. In addition to peer-reviewed
After a long quiet period of Covid pandemics, it is time to return to a many years’ long tradition:
With a distinctive staff of visitors, SiFive and OpenFive are coming to town to share information about their vision and key technologies that may revolutionize your very next design.
Come join us on a half day of information … Read More
Abstract Submissions
Ready to share and discuss the latest design and verification best practices with your peers from around the world?
It’s time for our annual Jasper™ User Group Conference. This interactive, in-depth technical conference connects designers, verification engineers, and engineering managers from around
Each 45-minute session offers a new opportunity to:
Each 45-minute session offers a new opportunity to:
Join industry leaders from Intel, Qualcomm, onsemi and Synopsys in the 4th annual, 2nd virtual CAD Navigation (CADNav) User’s Group Meeting as they share the latest innovations, methodologies and experiences using Synopsys CADNav tools, Avalon™ and SysNav™.
You’ll hear about successful deployment of Synopsys CADNAV tools… Read More
A Digital Event – November 10-11
Ready to share and discuss the latest design and verification best practices with your peers from around the world?
It’s time for our annual JasperTM User Group Conference, held on November 10 and 11 this year. This in-depth technical conference connects designers, verification engineers,… Read More
