Webinar: Minimize Layout Iterations and EM Errors with Simulation-Driven Routing

Webinar: Minimize Layout Iterations and EM Errors with Simulation-Driven Routing
by Admin on 05-03-2020 at 9:00 am

Overview

Electromigration (EM) has a major impact on IC reliability and lifespan. Long a concern for automotive, aerospace, and healthcare, EM is now a challenge for the entire microelectronics industry as we move to lower process nodes.

To address this concern, Cadence built upon its electrically aware design (EAD) technology

Read More