From initial process technology development (TD) to high volume manufacturing (HVM) status for a new node, one of the key support functions to improve and maintain yield is the in-line wafer inspection technology. Actually, there are multiple inspection technologies commonly employed, with tradeoffs in pixel resolution,… Read More
Workflows allow the world to function. The orderly process of sequencing tasks and automating handoffs creates tremendous potential for efficiency and error avoidance. As they say, time is money and workflows can save a lot of time. The principle applies in all kinds of industries. If you design chips for a living, you’re very … Read More
Similar to my last post on the HCL DevOps webinar series, I will cover their presentation of HCL Compass in a webinar that was recorded on July 29 about how HCL Compass delivers defect tracking and more.
This webinar was presented by Steve Boone, head of product management at HCL Software DevOps, Howie Bernstein, product manager… Read More
The world of IPs in the semiconductor landscape has completely changed the semiconductor design scenario, specifically the fabless design space. Today IPs are key components of any large semiconductor design, in the same way as auto ancillaries in auto design. It’s just the beginning, in the days to come we will see SoCs just as… Read More