Cell-Aware Test Seminar

Cell-Aware Test Seminar
by Beth Martin on 05-07-2013 at 8:05 pm

You may have heard about cell-aware testing. It’s a transistor-level test (ATPG) methodology that is quickly becoming a hot topic. If you are involved in DFT and are looking for better quality and reliability, you should definitely know about cell-aware testing.


And lucky you, on May 16, 2013, you can attend a free seminar on cell-aware… Read More


IC Test Sessions at SEMICON West 2012

IC Test Sessions at SEMICON West 2012
by Beth Martin on 07-02-2012 at 1:43 pm

SEMICON West is coming up this July 10-12 at the Moscone Center in San Francisco. It covers a broad swath of the microelectronics supply chain, but I was particularly interested in the test sessions. Here are two that I recommend.

The Value of Test for Semiconductor Yield Learning” on Tuesday, July 10, at 1:30p. The… Read More