Call-For-Abstract
2013 IEEE/ACM Workshop on Variability Modeling and Characterization (VMC)
Collocated with IEEE/ACM ICCAD, November 21, 2013, San Jose, CA, USA
Background
Variability has emerged as a fundamental challenge to IC design in scaled CMOS technology; and it
has profound impact on nearly all aspects of circuit performance. While some of the negative effects of variability can be handled with improvements in the manufacturing process, comprehensive methods are necessary to assess and manage the negative effects of variability, which in turn requires accurate and tractable variability models. The goal of the VMC workshop is to provide a forum for theoreticians and practitioners to freely exchange opinions on current practices as well as future research needs in variability modeling and characterization.
The workshop organizers strongly encourage the submission of early results in the related topics. The submissions will be evaluated by the Technical Program Committee, and the author(s) of the accepted submissions are expected to present the results in the format of posters at the workshop.
Topics
1. Fundamental physics of device variability
2. Compact variability modeling development and application
3. Statistical extraction of variability
4. Variability test structure design and calibration
5. Design interface with manufacturing and solutions for variability
6. Variability issues in emerging semiconductor technology
7. Temporal variability issues
8. Other relevant topics
Technical Program Committee
Co-chairs: Hidetoshi Onodera, Kyoto University
David Z. Pan, University of Texas at Austin
Rasit O Topaloglu, IBM
Members:
Asen Asenov, University of Glasgow
Yu Cao, Arizona State University
Chris Kim, University of Minnesota
Frank Liu, IBM Austin Research Lab
Colin McAndrew, Freescale Semiconductor
Vijay Reddy, Texas Instruments
Takashi Sato, Kyoto University
Format
Two page maximum in US Letter or A4 format. One page is strongly encouraged. Once
accepted, the authors are required to give a short oral introduction as well as poster presentation.
Timeline
Submission Deadline: September 20th, 2013
Notification of Acceptance: October 4th, 2013
Workshop Date: November 21st, 2013
Submission
Please send the abstract in PDF format to rasit@us.ibm.com, with subject “VMC2013 submission.”
Contact
Professor David Z. Pan, ECE Department, University of Texas at Austin, dpan@mail.utexas.edu
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