Hello,
I am reading the AEC and JEDEC standards and I see in several places that some tests can be avoided if "Generic Data" is available. Ill give you a few examples:
-Accelerated Soft Error Testing(JESD47): test with particle beams to estimate field soft error rate in volatile memory elements. Generic data from tests devices with alike memory elements may be substituted.
-AEC-Q100 2.4.1 Generic Data Definition: "The use of generic data to simplify the qualification process is strongly encouraged. Generic data can be submitted to the user as soon as it becomes available to determine the need for any additional testing. To be considered, the generic data must be based on a matrix of specific requirements associated with each characteristic of the device and manufacturing process as shown in Table 3 and Appendix 1." (Table 3 just indicates which tests apply given certain conditions ). "Appendix 1 defines the criteria by which components are grouped into a qualification family..."
I have a few rather basic questions as a fabless ASIC designer using a AEC qualified process, e.g. XT018:
-What generic data looks like, do I have to have the raw data of the test results? If designed a Bandgap for one design which was qualified in one ASIC can it be considered qualified for another design?
-If the foundry says the RAM cells have been subjected to "Accelerated Soft Error Testing" qualification according to JESD47, is this sufficient? Without any test results available for the qualification of an ASIC using this cells?
Thank you very much!
R
I am reading the AEC and JEDEC standards and I see in several places that some tests can be avoided if "Generic Data" is available. Ill give you a few examples:
-Accelerated Soft Error Testing(JESD47): test with particle beams to estimate field soft error rate in volatile memory elements. Generic data from tests devices with alike memory elements may be substituted.
-AEC-Q100 2.4.1 Generic Data Definition: "The use of generic data to simplify the qualification process is strongly encouraged. Generic data can be submitted to the user as soon as it becomes available to determine the need for any additional testing. To be considered, the generic data must be based on a matrix of specific requirements associated with each characteristic of the device and manufacturing process as shown in Table 3 and Appendix 1." (Table 3 just indicates which tests apply given certain conditions ). "Appendix 1 defines the criteria by which components are grouped into a qualification family..."
I have a few rather basic questions as a fabless ASIC designer using a AEC qualified process, e.g. XT018:
-What generic data looks like, do I have to have the raw data of the test results? If designed a Bandgap for one design which was qualified in one ASIC can it be considered qualified for another design?
-If the foundry says the RAM cells have been subjected to "Accelerated Soft Error Testing" qualification according to JESD47, is this sufficient? Without any test results available for the qualification of an ASIC using this cells?
Thank you very much!
R