Tessent SSN Enables Significant Test Time Savings for SoC ATPG

Tessent SSN Enables Significant Test Time Savings for SoC ATPG
by Kalar Rajendiran on 05-08-2023 at 6:00 am

Pattern Generation Block Level ATPG Flow

SoC test challenges arise due to the complexity and diversity of the functional blocks integrated into the chip. As SoCs become more complex, it becomes increasingly difficult to access all of the functional blocks within the chip for testing. SoCs also can contain billions of transistors, making it extremely time-consuming… Read More