SmartScan Addresses Test Challenges of SoCs

SmartScan Addresses Test Challenges of SoCs
by Pawan Fangaria on 09-04-2014 at 4:00 pm

With advancement of semiconductor technologies, ever increasing sizes of SoCs bank on higher densities of design rather than giving any leeway towards increasing chip area and package sizes; a phenomenon often overlooked. The result is – larger designs with lesser number of pins bonded out of ever shrinking package sizes;… Read More