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Radiation is everywhere. Radiation contributes to Single Event Effects (SEE) in semiconductor circuits and packaging. As chips get larger, containing more functions, and using lower voltage to reduce power, SEEs have become more significant to product reliability, Failures In Time rates (FIT), and meantime between failures… Read More
Issam Nofal is the CEO of IROC Technologies and has held various positions with the company for over 23 years as Product Manager, Project Leader, and R&D Engineer. He has authored several papers on test and reliability of Integrated Circuits. He holds a PhD in Microelectronics from Grenoble INP.
What is IROC Technologies’
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