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Cell-Aware Test Seminarby Beth Martin on 05-07-2013 at 8:05 pmCategories: EDA, Siemens EDA
You may have heard about cell-aware testing. It’s a transistor-level test (ATPG) methodology that is quickly becoming a hot topic. If you are involved in DFT and are looking for better quality and reliability, you should definitely know about cell-aware testing.
And lucky you, on May 16, 2013, you can attend a free seminar on cell-aware… Read More
