A Better Way for Analog Designers to Perform Variation Analysis

A Better Way for Analog Designers to Perform Variation Analysis
by Tom Dillinger on 04-18-2016 at 7:00 am

The impact of process variation at advanced nodes is increasing — no surprise there. In recent years, the principal design emphasis to better reflect this variation has been the adoption of two new methodologies: (1) advanced on-chip variation (AOCV, as well as POCV/LVF) for digital static timing analysis, and (2) advanced… Read More