Self-Monitoring SoCs – An Idea Coming of Age

Self-Monitoring SoCs – An Idea Coming of Age
by Mitch Heins on 12-15-2017 at 12:00 pm

In a former life I was the GM of a business where we built specialized structures used for semiconductor process bring-up, characterization and monitoring. These monitoring structures were placed in wafer scribe-lines and were used to monitor key parameters during wafer processing. The structures provided feedback to automated… Read More