Layout parasitic extraction (LPE) has three primary goals – accuracy, capacity, and throughput. Traditionally, LPE tools have offered two methods for capacitance derivation, with tradeoffs on these goals:… Read More
As I travel a lot in the last 15 years and visited customers as well as friends I was many times invited to talk to the Layout teams. The main purpose is always to encourage automation. So I developed a presentation related to market trend, technology trends, and latest tools advancements. In many cases I present updates from DAC (Design… Read More
According to the IEEE Std 1012-2012, verification is the acknowledgement that a product is in satisfactory condition by meeting a set of rigorous criteria. [3] Transistor-level verification involves the use of custom libraries and design models to achieve ultimate performance, low power, or layout density. [2] Prediction… Read More
Perhaps the most pertinent comment raised by an analyst at Intel’s Investor Forum last week came from Dan Hutcheson of VLSI Research to Brian Krzanich, the COO and head of global manufacturing and supply chain. He said: “I think you sold yourself short on Trigate, the benefit of fully depleted vs. planar and the impact on leakage.”… Read More
