Bluetooth LE Audio and Voice user Interfaces for next generation wireless earbuds
AI processing for neural network-based applications and computer vision for camera-enabled devices in smartphones, wearables, ADAS and surveillance
Bluetooth Low Energy, NB-IoT, and Sensor Fusion solutions for robotics, AR/VR, motion controllers and IoT
Do you want to find out, hands-on, how many of the leading fabless semiconductor companies are verifying their complex 2.5/3D heterogeneous and homogeneous package assemblies? Here is your chance to meet our technical staff and ask your questions. Come and see why fabless semiconductor companies are adopting this… Read More
Do you want to find out, hands-on, how many of the leading fabless semiconductor companies are verifying their complex 2.5/3D heterogeneous and homogeneous package assemblies? Here is your chance to meet our technical staff and ask your questions. Come and see why fabless semiconductor companies are adopting this… Read More
Test for the Autonomous Age
The seminar will focus on three key test challenges IC vendors face as they try to make the promises of the autonomous age a reality.
Reducing power consumption is a mainstream and essential design requirement for many industry segments; including networking, milaero, mobile, automotive, consumer, IoT and many others. Besides using power management techniques, design teams are also trying to reduce their power in the RTL design process by reducing… Read More
The ever-demanding and expanding applications in automotive, high-performance computing, mobile, and IoT are the driving force behind the increasing complexity of today’s semiconductor designs. Because of this, design and verification methodologies that were “good enough” in the past, are no longer adequate … Read More
What: Better IP Test with IJTAG
When: 26 March, 2013, 10:30am-1:30pm
Where: Mentor Graphics, 46871 Bayside Parkway, Fremont, CA 94538
If you are involved in IC test*, you’ve probably heard about the IEEE P1687 standard, called IJTAG for ‘internal’ JTAG. IJTAG defines a standard for embedded IP that includes simple… Read More
Last week I attended the Ansys/Apache seminars on “Dimensions of Electronic Design.” The two big challenges as we go down to 28nm and 20nm and below are keeping power manageable and keeping reliability up.
The big challenge with power is that we can put so much stuff on a die and clock it so fast that the power is exceeding… Read More
