yieldHUB to demo real-time semiconductor test analytics at ITC 2026

[AmandaK]

yieldHUB exhibits at International Test Conference 2026, booth 602, San Antonio, Oct 13-15. Live demos of yieldHUB Live real-time semiconductor test analytics.

Limerick, Ireland, September 21, 2026 yieldHUB, a semiconductor yield management software company whose analytics support the production of more than 60 billion chips per year, will exhibit at the International Test Conference (ITC) 2026 at the Grand Hyatt River Walk in San Antonio, Texas. yieldHUB will host live demonstrations at booth 602 on the exhibit floor from Tuesday, October 13 through Thursday, October 15, 2026.

Kevin Robinson, VP of Operations, and Carl Moore, Yield Management Specialist, will represent yieldHUB at booth 602 across all three exhibit days.

The focus of the booth is yieldHUB Live, a real-time semiconductor test analytics product that analyzes test data while a lot is still running on the tester.

What yieldHUB Live does​

yieldHUB Live is real-time manufacturing intelligence software for semiconductor test floors. Instead of waiting for post-lot reporting, it analyzes test data device by device on the tester, without adding test time, and returns a fix, continue, or stop recommendation in seconds.

Core capabilities include:

• - Live device-by-device test analysis during wafer probe and final test, with no added test time
• - Parametric monitoring and drift detection while the lot is in progress
• - Automated fix, continue, or stop recommendations delivered in seconds
• - Idle tester detection the moment equipment goes idle
• - Configurable real-time dashboards built for factory-floor visibility
• - Broad tester compatibility across legacy and next-generation platforms, with no hardware upgrades required
• - Rapid, non-disruptive setup that runs alongside existing test programs, with no changes to test flows and no production downtime

The measurable outcomes are higher first-pass yield, increased overall equipment effectiveness (OEE), and recovered test capacity from testers already installed, delivering capacity gains without capital expenditure.

Deployment is seamless and scalable

yieldHUB Live is designed to be added to a running test floor rather than scheduled around it. It works with existing testers, existing test programs, and existing data formats, so there are no hardware upgrades, no test program rewrites, and no interruption to production while it is brought online.

Also on exhibition at booth 602​

yieldHUB NPI accelerates semiconductor new product introduction from first silicon to production. It provides drift analysis for burn-in, life test, and guard-banding; Gage R&R to identify tests sensitive to setup variation; and characterization tools including virtual retest, outlier analysis, and multivariate analysis, so test qualification issues surface before product release rather than after.

The yieldHUB platform is the enterprise yield management system that centralizes, cleanses, correlates, and reports on semiconductor test data across fab, wafer sort, probe, and final test in a single database. It is used by fabless companies, integrated device manufacturers (IDMs), OSATs, foundries, and high-reliability manufacturers in 21 countries.

Executive commentary​

"ITC is where the people who actually run test floors come together, and that is exactly who yieldHUB Live was built for," said John O'Donnell, Founder and CEO of yieldHUB. "For twenty-one years we have helped semiconductor companies understand their test data after the fact. Live moves that intelligence to where the decision is still worth making, while the lot is on the tester. We are looking forward to three days of those conversations at booth 602."

"When an engineer sees a drift alert mid-lot instead of the next morning, the conversation changes completely, from explaining scrap to preventing it," said Gillian O'Donnell, Director of Growth at yieldHUB. "We will be running demonstrations throughout the three days, and we would encourage anyone with a test capacity or first-pass yield problem to bring us their scenario."

Visit yieldHUB at ITC 2026​

• Event: International Test Conference (ITC) 2026
• Venue: Grand Hyatt River Walk, San Antonio, Texas, USA
• Exhibit dates: Tuesday, October 13 to Thursday, October 15, 2026
• Booth: 602

Demonstrations of yieldHUB Live, yieldHUB NPI, and the yieldHUB platform run continuously across all three exhibit days, and the yieldHUB team will be available throughout to discuss real-time test analytics with attendees. Engineering and operations teams who want a dedicated session can pre-book a meeting at yieldhub.com/contact or https://calendar.app.google/Ueye5c9hs5oLZAdf9

Media contact

Gillian O'Donnell, Director of Growth, communications@yieldhub.com

Link to Press Release