[params] => Array
 => /forum/index.php?members/liwatson777.321780/
[addOns] => Array
[DL6/MLTP] => 13
[Hampel/TimeZoneDebug] => 1000070
[SV/ChangePostDate] => 2010200
[SemiWiki/Newsletter] => 1000010
[SemiWiki/WPMenu] => 1000010
[SemiWiki/XPressExtend] => 1000010
[ThemeHouse/XLink] => 1000970
[ThemeHouse/XPress] => 1010570
[XF] => 2021270
[XFI] => 1050270
[wordpress] => /var/www/html
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What is Dynamic PAT?
uses dynamic statistical techniques to establish the limits on these test results for semiconductor manufacturing process improvement.