Webinar: Streamlining Requirements Traceability Using Questa Verification IQ Testplan Author

Online

Wednesday, May 28 - 8:00 AM Pacific Managing traceability across multiple disconnected tools and data is a challenge that often leads to inefficiencies, missed coverage, and increased risk in safety-critical designs. In this webinar, discover how Questa Verification IQ Testplan Author seamlessly integrates with Application Lifecycle Management tools (such as Siemens Polarion and Jama Connect) …

Webinar: Enhancing Automotive Safety Verification Using Questa One Sim FX

Online

Wednesday, June 4 - 8:00 AM Pacific In today's automotive electronics, ensuring functional safety is paramount for meeting stringent industry standards. This webinar introduces Questa One Sim FX, a cutting-edge fault simulation platform designed specifically for complex automotive designs. We'll explore how this high-performance tool revolutionizes the safety verification process through intelligent fault injection at …

Webinar: Tackling Emerging DFT Verification Challenges with Questa One

This course will be held Online

Rising semiconductor complexity—driven by multi-die architectures, the move towards more advanced technology nodes, and more stringent reliability targets, is dramatically increasing the volume of verification required to achieve DFT verification sign-off. Come learn how the Questa One DFT Verification solution, combined with Tessent Silicon Lifecycle Solutions delivers an evolution in user experience and performance to …

Webinar: Accelerating Functional Coverage with Questa One Sim CX

Online

This webinar introduces Questa One Sim CX, an innovative coverage-driven simulation solution that revolutionizes SystemVerilog UVM verification workflows. Traditional coverage closure methods, relying on constrained-random stimulus generation and iterative manual adjustments, often prove time-consuming and resource-intensive. Questa One Sim CX addresses these challenges by automatically inferring relationships between functional coverage bins and randomized stimulus variables, …