Failures during manufacturing and assembly or in the field caused by charged device model (CDM) type ESD events are a serious concern for IC design teams. CDM failures are generally caused by charge build-up on device packages, which capacitively charge large internet nets, such as GND or VSS. Once a device pin contacts a current …
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Click Here to Register to View the Video PowerMOS devices play a major role in a variety of power converter and control circuits. Some examples of their applications include PMICs or boost and buck converters. Often these are used in mobile and IoT devices to convert battery voltages to circuit operating voltages. Analysis tools are …
High performance power transistors are used in power management ICs, where switching behavior is extremely important. However, due to their large distributed gate and active area structure, accurately simulating switching activity to improve performance and minimize switching power loss can be challenging. Uncorrected current crowding from nonuniform current flows can cause chip failures and reliability …
Verifying the Electrostatic Discharge (ESD) protection network on an IC can be challenging, and if it is not done correctly it can lead to failures on the tester, reduced product …
