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DTSTART;TZID=America/Los_Angeles:20260508T100000
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UID:368403-1778234400-1778238000@semiwiki.com
SUMMARY:Webinar: How Data Rates Doubled\, and Where Validation Reaches Its Limit
DESCRIPTION:Data rates have doubled\, but validation methods have not kept pace. As PCIe\, DDR\, and multi-terabit optical interconnects evolve\, engineers are encountering signal integrity challenges much earlier in the design process. \nJoin Niels Fache\, Senior Vice President and General Manager of Design Engineering Software at Keysight\, to explore where validation becomes more challenging as speeds increase\, and how engineering teams are adapting. You’ll learn how simulation\, architecture modeling\, and high-fidelity measurement help validate designs before silicon exists and reduce downstream risk. \nREGISTER HERE
URL:https://semiwiki.com/event/webinar-how-data-rates-doubled-and-where-validation-reaches-its-limit/
LOCATION:Online
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BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260515T100000
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CREATED:20260414T062904Z
LAST-MODIFIED:20260414T062904Z
UID:368405-1778839200-1778842800@semiwiki.com
SUMMARY:Webinar: How Frequency Ranges Expanded\, and Why Measurement Fidelity Became Critical
DESCRIPTION:As systems move into higher frequencies and wider bandwidths\, small measurement errors can lead to costly design decisions. Engineers working in wireless\, radar\, satellite\, and optical domains must now validate signals that push existing tools to their limits. \nJoin Jun Chie\, Vice President of Product Management at Keysight\, to explore where measurement fidelity begins to break down\, and how engineers are adapting. You’ll see how next-generation instrumentation helps improve signal accuracy\, reduce uncertainty\, and increase confidence in design decisions. \nREGISTER HERE
URL:https://semiwiki.com/event/webinar-how-frequency-ranges-expanded-and-why-measurement-fidelity-became-critical/
LOCATION:Online
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DTSTART;TZID=America/Los_Angeles:20260522T100000
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CREATED:20260414T063003Z
LAST-MODIFIED:20260414T063003Z
UID:368408-1779444000-1779447600@semiwiki.com
SUMMARY:Webinar: How System Scale Expanded\, and Why Network Traffic Validation Became Essential
DESCRIPTION:AI data center networks now operate at a scale where device-level validation no longer reflects real performance. Engineers must understand how systems behave under realistic traffic conditions\, not just in isolated tests. \nJoin Ram Periakaruppan\, vice president and general manager of network applications and security at Keysight\, to learn how large-scale traffic emulation reveals congestion\, latency issues\, and performance limits. You’ll see how to validate AI infrastructure under real workloads and ensure it performs reliably at scale. \nREGISTER HERE
URL:https://semiwiki.com/event/webinar-how-system-scale-expanded-and-why-network-traffic-validation-became-essential/
LOCATION:Online
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DTSTART;TZID=America/Los_Angeles:20260529T100000
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DTSTAMP:20260423T145514
CREATED:20260414T063056Z
LAST-MODIFIED:20260414T063056Z
UID:368410-1780048800-1780052400@semiwiki.com
SUMMARY:Webinar: How Manufacturing Complexity Increased\, and Why Validation Had to Evolve
DESCRIPTION:As semiconductor complexity increases and board designs become denser\, manufacturing teams face tighter tolerances\, reduced test access\, and rising pressure to maintain yield and throughput. Validating RF performance and high-speed digital signal integrity at production scale adds a new layer of complexity that traditional approaches struggle to address. \nJoin Jason Kary\, Senior Vice President and President of Keysight’s Electronic Industrial Solutions Group\, to explore how manufacturing validation is evolving. You’ll learn how wafer-level and in-circuit test strategies improve coverage\, detect defects earlier\, and enable consistent\, high-volume production at scale without compromising quality. \nREGISTER HERE
URL:https://semiwiki.com/event/webinar-how-manufacturing-complexity-increased-and-why-validation-had-to-evolve/
LOCATION:Online
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