BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//SemiWiki - ECPv6.16.3//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-ORIGINAL-URL:https://semiwiki.com
X-WR-CALDESC:Events for SemiWiki
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:America/Los_Angeles
BEGIN:DAYLIGHT
TZOFFSETFROM:-0800
TZOFFSETTO:-0700
TZNAME:PDT
DTSTART:20250309T100000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0700
TZOFFSETTO:-0800
TZNAME:PST
DTSTART:20251102T090000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0800
TZOFFSETTO:-0700
TZNAME:PDT
DTSTART:20260308T100000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0700
TZOFFSETTO:-0800
TZNAME:PST
DTSTART:20261101T090000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0800
TZOFFSETTO:-0700
TZNAME:PDT
DTSTART:20270314T100000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0700
TZOFFSETTO:-0800
TZNAME:PST
DTSTART:20271107T090000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;VALUE=DATE:20260609
DTEND;VALUE=DATE:20260612
DTSTAMP:20260604T154314
CREATED:20260528T211857Z
LAST-MODIFIED:20260528T211857Z
UID:369719-1780963200-1781222399@semiwiki.com
SUMMARY:Introduction to CODE V Training
DESCRIPTION:About this event\nThis short course covers the fundamentals of modeling\, analyzing\, optimizing\, and tolerancing image-forming optical systems in CODE V through demonstrations and hands-on workshops. \nParticipants should be familiar with core optics concepts and terminology. \nBy the end of this course\, you will be able to: \n\nBuild a CODE V model of an optical system from design parameters\nAnalyze system performance using standard image-quality metrics\nApply optimization techniques to improve image quality\nAssess manufacturability and tolerance sensitivity of the final design\n\nAttendees must provide a laptop with the latest version of CODE V installed. Please review the CODE V hardware and operating system requirements in advance. \nPlease install CODE V before the first day of class. A download link to course materials will be provided prior to the course. \nThe fee for this short course is $1\,200. \nAttendance is limited. Minimum enrollment is required to run the course. \n\n\n\n\n\n\nWho should attend this event?\nThis course is designed for engineers and technical professionals who want to build practical skills in optical system design using CODE V. It is especially valuable for: \n\nOptical engineers seeking hands-on experience with modeling\, analysis\, and optimization of image-forming systems\nLens designers looking to strengthen their ability to evaluate and improve image quality\nEngineers involved in imaging system development who need to understand performance metrics and tolerancing\nProfessionals responsible for assessing manufacturability and sensitivity in optical designs\nResearchers and advanced users who are familiar with core optics principles and want to apply them in a structured\, software-driven workflow\n\nParticipants should already have a working knowledge of fundamental optics concepts and terminology to get the most out of this course. \n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/introduction-to-code-v-training/
LOCATION:5301 Stevens Creek Blvd\, 5301 Stevens Creek Blvd\, Santa Clara\, CA\, 95051\, United States
ATTACH;FMTTYPE=image/png:https://semiwiki.com/wp-content/uploads/2026/05/Screenshot-2026-05-28-141825.png
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260611T083000
DTEND;TZID=America/Los_Angeles:20260611T170000
DTSTAMP:20260604T154314
CREATED:20260528T212315Z
LAST-MODIFIED:20260528T212315Z
UID:369729-1781166600-1781197200@semiwiki.com
SUMMARY:Manufacturing Test Midwest User Group
DESCRIPTION:About this event\nManufacturing test is evolving fast — and teams need smarter\, more connected approaches to keep pace. \nJoin the Manufacturing Test Midwest User Group to explore how modern tools and workflows are transforming how production test is designed\, validated\, and scaled. From inline automation and fixture embedded electronics to next-generation ICT\, boundary scan\, and functional test\, see how these solutions are applied in real-world environments. \nGet early insight into emerging test technologies\, learn practical techniques to improve coverage and efficiency\, and experience hands-on demos with the tools you use every day. \n\n\n\n\n\n\nWho should attend this event?\nThis event is ideal for test engineers\, managers\, and executives looking to improve efficiency and stay ahead of evolving manufacturing demands. Expand your expertise\, connect with peers\, and gain insight into what’s next in electronic manufacturing test. \n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/manufacturing-test-midwest-user-group/
LOCATION:Novi\, MI\, Novi\, MI\, Novi\, MI\, United States
ATTACH;FMTTYPE=image/png:https://semiwiki.com/wp-content/uploads/2026/05/Screenshot-2026-05-28-142230.png
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/Los_Angeles:20260611T100000
DTEND;TZID=America/Los_Angeles:20260611T110000
DTSTAMP:20260604T154314
CREATED:20260528T212431Z
LAST-MODIFIED:20260528T212431Z
UID:369732-1781172000-1781175600@semiwiki.com
SUMMARY:Webinar: How Frequency Ranges Expanded\, and Why Measurement Fidelity Became Critical
DESCRIPTION:About this event\nEngineering at the Edge Webinar Series – Episode 2 \nAs systems move into higher frequencies and wider bandwidths\, small measurement errors can lead to costly design decisions. Engineers working in wireless\, radar\, satellite\, and optical domains must now validate signals that push existing tools to their limits. \nJoin Jun Chie\, Vice President of Product Management at Keysight\, to explore where measurement fidelity begins to break down\, and how engineers are adapting. You’ll see how next-generation instrumentation helps improve signal accuracy\, reduce uncertainty\, and increase confidence in design decisions. \n\n\n\n\n\n\nWho should attend this event?\nRF\, microwave\, and wireless engineers in aerospace\, satellite\, and communications should attend. This session fits teams who need precise\, high-frequency measurement and improved signal accuracy. \n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/webinar-how-frequency-ranges-expanded-and-why-measurement-fidelity-became-critical-2/
LOCATION:Online
ATTACH;FMTTYPE=image/png:https://semiwiki.com/wp-content/uploads/2026/05/Screenshot-2026-05-28-142402.png
END:VEVENT
END:VCALENDAR