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DTSTART;VALUE=DATE:20260719
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UID:370358-1784419200-1784678399@semiwiki.com
SUMMARY:10th Edition — IEEE International Test Conference INDIA 2026
DESCRIPTION:International Test Conference is the world’s premier venue dedicated to the electronic test of devices\, boards and systems-covering the complete cycle from design verification\, design-for-test\, design-for-manufacturing\, silicon debug\, manufacturing test\, system test\, diagnosis\, reliability and failure analysis\, and back to process and design improvement. \nAt IEEE ITC India\, design\, test\, and yield professionals can confront challenges faced by the industry\, and learn how these challenges are being addressed by the combined efforts of academia\, design tool and equipment suppliers\, designers\, and test engineers. \nWho should attend?\n\nStudents\, researchers\, faculty\, and industry professionals in VLSI\, semiconductor testing\, and electronics are encouraged to attend. \nIt is ideal for anyone interested in chip design\, validation\, and emerging test technologies. \n\nIs the conference fully offline\, virtual\, or hybrid?\n\nIEEE ITC India 2026 is primarily an in-person (offline) conference to enable better networking and collaboration. \nSome sessions may be accessible in hybrid or virtual mode based on final arrangements. \n\n\n\nWhat are the key focus areas?\n\nThe conference covers VLSI testing\, DFT\, silicon debug\, reliability\, and hardware security. \nIt also includes emerging areas like AI in testing and next-gen technologies such as IoT and 5G/6G. \n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/10th-edition-ieee-international-test-conference-india-2026/
LOCATION:Radisson Blu Bengaluru\, Radisson Blu Bengaluru\, Bangalore\, India
ATTACH;FMTTYPE=image/png:https://semiwiki.com/wp-content/uploads/2026/06/Screenshot-2026-06-16-133626.png
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