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DTSTART;VALUE=DATE:20260309
DTEND;VALUE=DATE:20260313
DTSTAMP:20260412T233154
CREATED:20250624T161151Z
LAST-MODIFIED:20250624T161151Z
UID:357528-1773014400-1773359999@semiwiki.com
SUMMARY:Semitracks Course: Semiconductor Reliability and Product Qualification
DESCRIPTION:Product reliability and qualification continues to evolve with the electronics industry. New electronics applications require new approaches to reliability and qualification. In the past\, reliability meant discovering\, characterizing and modeling failure mechanisms\, and determining their impact on the reliability of the circuit. Today\, reliability can involve tradeoffs between performance and reliability; assessing the impact of new materials; dealing with limited margins\, and other factors. This requires information on subjects like: statistics\, testing\, technology\, processing\, materials science\, chemistry\, and customer expectations. While customers expect high reliability levels\, incorrect testing\, calculations\, and qualification procedures can severely impact reliability. Semiconductor Reliability and Product Qualification is a 4-day course that offers detailed instruction on a variety of subjects pertaining to semiconductor reliability and qualification. This course is designed for every manager\, engineer\, and technician concerned with reliability in the semiconductor field\, qualifying semiconductor components\, or supplying tools to the industry. \n\n\nWhat Will I Learn By Taking This Class?\nParticipants will learn to develop the skills to determine what failure mechanisms might occur\, and how to test for them\, develop models for them\, and eliminate them from the product. This skill building series is divided into four segments: \n\nOverview of Reliability and Statistics. Participants will learn the fundamentals of statistics\, sample sizes\, distributions and their parameters.\nFailure Mechanisms. Participants will learn the nature and manifestation of a variety of failure mechanisms that can occur both at the die and at the package level. These include: time-dependent dielectric breakdown\, hot carrier degradation\, electromigration\, stress-induced voiding\, moisture\, corrosion\, contamination\, thermomechanical effects\, interfacial fatigue\, and others.\nQualification Principles. Participants will learn how test structures can be designed to help test for a particular failure mechanism.\nTest Strategies. Participants will learn about the JEDEC test standards\, how to design screening tests\, and how to perform burn-in testing effectively.\n\n\n\n\n\nCourse Objectives\n\nThis course will provide participants with an in-depth understanding of the failure mechanisms\, test structures\, equipment\, and testing methods used to achieve today’s high reliability components.\nParticipants will be able to gather data\, determine how best to plot the data and make inferences from that data.\nThis course will identify the major failure mechanisms\, explain how they are observed\, how they are modeled\, and how they are eliminated.\nThis course will offer a variety of video demonstrations of analysis techniques\, so the participants can get an understanding of the types of results they might expect to see with their equipment.\nParticipants will be able to identify the steps and create a basic qualification process for semiconductor devices.\nParticipants will be able to knowledgeably implement screens that are appropriate to assure the reliability of a component.\nParticipants will be able to identify appropriate tools to purchase when starting or expanding a laboratory.\n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/semitracks-course-semiconductor-reliability-and-product-qualification/
LOCATION:Munich\, Germany\, Munich\, Germany
ATTACH;FMTTYPE=image/png:https://semiwiki.com/wp-content/uploads/2025/06/Screenshot-2025-06-24-085557.png
ORGANIZER;CN="Semitracks%2C Inc.":MAILTO:info@semitracks.com
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BEGIN:VEVENT
DTSTART;VALUE=DATE:20260310
DTEND;VALUE=DATE:20260313
DTSTAMP:20260412T233154
CREATED:20250828T050840Z
LAST-MODIFIED:20250828T050840Z
UID:361050-1773100800-1773359999@semiwiki.com
SUMMARY:embedded world 2026
DESCRIPTION:Global platform for the embedded community\nThe embedded world Exhibition&Conference provides a global platform and a place to meet for the entire embedded community\, including leading experts\, key players and industry associations. It offers unprecedented insight into the world of embedded systems\, from components and modules to operating systems\, hardware and software design\, M2M communication\, services\, and various issues related to complex system design. \nIts expertise and sharp focus on technologies\, processes and future-oriented products make it unparalleled in international comparisons – and THE must-attend event for developers\, system architects\, product managers and technical management. \n\nThe No. 1 hub for the international embedded community\n\n\n\nAs the global platform and the industry place to meet for the embedded community\, embedded world attracts the top experts\, key players and industry associations from all over the world. \nBecome part of the community and use THE industry platform to network and make valuable business contacts! \n\n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/embedded-world-2026/
LOCATION:Exhibition Centre Nuremberg\, Exhibition Centre Nuremberg\, Messezentrum 1\, Nürnberg\, 90471\, Germany
ATTACH;FMTTYPE=image/jpeg:https://semiwiki.com/wp-content/uploads/2025/08/145-embedded-world-2026.jpg
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BEGIN:VEVENT
DTSTART;VALUE=DATE:20260316
DTEND;VALUE=DATE:20260318
DTSTAMP:20260412T233154
CREATED:20250624T161345Z
LAST-MODIFIED:20250624T161345Z
UID:357530-1773619200-1773791999@semiwiki.com
SUMMARY:Semitracks Course: EOS\, ESD and How to Differentiate
DESCRIPTION:Electrical Overstress (EOS) and Electrostatic Discharge (ESD) account for most of the field failures observed in the electronics industry. Although EOS and ESD damage can at times look quite similar to each other\, the source each and the solution can be quite different. Therefore\, it is important to be able to distinguish between the two mechanisms. The semiconductor industry needs knowledgeable engineers and scientists to understand these issues. EOS\, ESD and How to Differentiate is a 2-day course that offers detailed instruction on EOS\, ESD and how to distinguish between them. This course is designed for every manager\, engineer\, and technician concerned with EOS\, ESD\, analyzing field returns\, determining impact\, and developing mitigation techniques. \n\n\nWhat Will I Learn By Taking This Class?\nParticipants will learn to develop the skills to determine what constitutes good EOS and ESD design\, how to recognize devices that can reduce EOS and ESD susceptibility\, and how to design new EOS and ESD structures for a variety of technologies. This skill-building series is divided into five segments: \n\nOverview of the EOS Failure Mechanism. Participants will learn the fundamentals of EOS\, the physics behind overstress conditions\, sources of EOS\, test equipment\, and the results of failure.\nOverview of the ESD Failure Mechanism. Participants will learn the fundamentals of ESD\, the physics behind static generation and discharge\, test equipment\, test protocols\, and the results of failure.\nESD Circuit Design Issues. Participants will learn how designers develop circuits to protect against ESD damage. This includes MOSFETs\, diodes\, off-chip driver circuits\, receiver circuits\, and power clamps.\nHow to Differentiate. Participants will learn how to tell the difference between EOS and ESD. They will learn how to simulate damage and interpret pulse widths\, amplitudes and polarity.\nResolving EOS and ESD on the Manufacturing Floor. Participants will see a number of common problems and their origins.\n\n\n\n\n\nCourse Objectives\n\nThis course will provide participants with an in-depth understanding of electrical overstress\, the models used for EOS\, and the manifestation of the mechanism.\nParticipants will be able to understand the ESD failure mechanism\, test structures\, equipment\, and testing methods used to achieve robust ESD resistance in today’s components.\nThis course will identify the major issues associated with ESD\, explain how they occur\, how they are modeled\, and how they are mitigated.\nParticipants will be able to identify basic ESD structures and how they are used to help reduce ESD susceptibility on semiconductor devices.\nParticipants will be able to distinguish between EOS and ESD when performing a failure analysis.\nParticipants will be able to estimate a pulse width\, pulse amplitude\, and determine the polarity of an EOS or ESD event.\nParticipants will see examples of common problems that result in EOS and ESD in the manufacturing environment.\n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/semitracks-course-eos-esd-and-how-to-differentiate/
LOCATION:Munich\, Germany\, Munich\, Germany
ATTACH;FMTTYPE=image/png:https://semiwiki.com/wp-content/uploads/2025/06/Screenshot-2025-06-24-085557.png
ORGANIZER;CN="Semitracks%2C Inc.":MAILTO:info@semitracks.com
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