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DTSTART;VALUE=DATE:20260316
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DTSTAMP:20260417T084615
CREATED:20250624T161345Z
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UID:357530-1773619200-1773791999@semiwiki.com
SUMMARY:Semitracks Course: EOS\, ESD and How to Differentiate
DESCRIPTION:Electrical Overstress (EOS) and Electrostatic Discharge (ESD) account for most of the field failures observed in the electronics industry. Although EOS and ESD damage can at times look quite similar to each other\, the source each and the solution can be quite different. Therefore\, it is important to be able to distinguish between the two mechanisms. The semiconductor industry needs knowledgeable engineers and scientists to understand these issues. EOS\, ESD and How to Differentiate is a 2-day course that offers detailed instruction on EOS\, ESD and how to distinguish between them. This course is designed for every manager\, engineer\, and technician concerned with EOS\, ESD\, analyzing field returns\, determining impact\, and developing mitigation techniques. \n\n\nWhat Will I Learn By Taking This Class?\nParticipants will learn to develop the skills to determine what constitutes good EOS and ESD design\, how to recognize devices that can reduce EOS and ESD susceptibility\, and how to design new EOS and ESD structures for a variety of technologies. This skill-building series is divided into five segments: \n\nOverview of the EOS Failure Mechanism. Participants will learn the fundamentals of EOS\, the physics behind overstress conditions\, sources of EOS\, test equipment\, and the results of failure.\nOverview of the ESD Failure Mechanism. Participants will learn the fundamentals of ESD\, the physics behind static generation and discharge\, test equipment\, test protocols\, and the results of failure.\nESD Circuit Design Issues. Participants will learn how designers develop circuits to protect against ESD damage. This includes MOSFETs\, diodes\, off-chip driver circuits\, receiver circuits\, and power clamps.\nHow to Differentiate. Participants will learn how to tell the difference between EOS and ESD. They will learn how to simulate damage and interpret pulse widths\, amplitudes and polarity.\nResolving EOS and ESD on the Manufacturing Floor. Participants will see a number of common problems and their origins.\n\n\n\n\n\nCourse Objectives\n\nThis course will provide participants with an in-depth understanding of electrical overstress\, the models used for EOS\, and the manifestation of the mechanism.\nParticipants will be able to understand the ESD failure mechanism\, test structures\, equipment\, and testing methods used to achieve robust ESD resistance in today’s components.\nThis course will identify the major issues associated with ESD\, explain how they occur\, how they are modeled\, and how they are mitigated.\nParticipants will be able to identify basic ESD structures and how they are used to help reduce ESD susceptibility on semiconductor devices.\nParticipants will be able to distinguish between EOS and ESD when performing a failure analysis.\nParticipants will be able to estimate a pulse width\, pulse amplitude\, and determine the polarity of an EOS or ESD event.\nParticipants will see examples of common problems that result in EOS and ESD in the manufacturing environment.\n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/semitracks-course-eos-esd-and-how-to-differentiate/
LOCATION:Munich\, Germany\, Munich\, Germany
ATTACH;FMTTYPE=image/png:https://semiwiki.com/wp-content/uploads/2025/06/Screenshot-2025-06-24-085557.png
ORGANIZER;CN="Semitracks%2C Inc.":MAILTO:info@semitracks.com
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