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SUMMARY:Webinar: How Manufacturing Complexity Increased\, and Why Validation Had to Evolve
DESCRIPTION:About this event\nEngineering at the Edge Webinar Series – Episode 4 \nAs semiconductor complexity increases and board designs become denser\, manufacturing teams face tighter tolerances\, reduced test access\, and rising pressure to maintain yield and throughput. Validating RF performance and high-speed digital signal integrity at production scale adds a new layer of complexity that traditional approaches struggle to address. \nJoin Jason Kary\, Senior Vice President and President of Keysight’s ElectronicIndustrial Solutions Group\, to explore how manufacturing validation is evolving. You’ll learn how wafer-level and in-circuit test strategies improve coverage\, detect defects earlier\, and enable consistent\, high-volume production at scale without compromising quality. \n\n\n\n\n\n\nWho should attend this event?\nSemiconductor and electronics manufacturing engineers should attend. This session fits teams focused on test coverage\, yield improvement\, and high-volume production validation. \n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/webinar-how-manufacturing-complexity-increased-and-why-validation-had-to-evolve-2/
LOCATION:Online
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