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DTSTART;TZID=America/Los_Angeles:20260508T100000
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SUMMARY:Webinar: How Data Rates Doubled\, and Where Validation Reaches Its Limit
DESCRIPTION:Data rates have doubled\, but validation methods have not kept pace. As PCIe\, DDR\, and multi-terabit optical interconnects evolve\, engineers are encountering signal integrity challenges much earlier in the design process. \nJoin Niels Fache\, Senior Vice President and General Manager of Design Engineering Software at Keysight\, to explore where validation becomes more challenging as speeds increase\, and how engineering teams are adapting. You’ll learn how simulation\, architecture modeling\, and high-fidelity measurement help validate designs before silicon exists and reduce downstream risk. \nREGISTER HERE
URL:https://semiwiki.com/event/webinar-how-data-rates-doubled-and-where-validation-reaches-its-limit/
LOCATION:Online
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DTSTART;VALUE=DATE:20260512
DTEND;VALUE=DATE:20260513
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SUMMARY:User2User Europe 2026
DESCRIPTION:Join us in Munich where peer-delivered technical sessions were be shared across a breadth of topics so you can explore new concepts or dive deep in your core area of expertise with fellow like-minded professionals. \nSpeaker submissions now open! \nAbout User2User\nThe User2User conference is your opportunity to learn\, grow and connect with fellow technical experts who design leading-edge products using Siemens electronic design automation (EDA) tools. \nWhat to expect?\nThe Siemens User2User conference provides a dedicated environment for exchanging ideas\, information and best practices that enable you to lead in your role and achieve success with your customers. \n\nTechnical agenda concentrated on the digital future\nIndustry leaders exploring macro trends and innovation\nSuper users sharing business challenges and roadblocks\nCase studies demonstrating business results\nNetworking with like-minded peers in EDA\n\nREGISTER HERE
URL:https://semiwiki.com/event/user2user-europe-2026/
LOCATION:Munich\, Germany
ATTACH;FMTTYPE=image/avif:https://semiwiki.com/wp-content/uploads/2026/01/siemens-user2user-conference-2023-04-13-1539.avif
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DTSTART;TZID=America/Los_Angeles:20260515T100000
DTEND;TZID=America/Los_Angeles:20260515T110000
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SUMMARY:Webinar: How Frequency Ranges Expanded\, and Why Measurement Fidelity Became Critical
DESCRIPTION:As systems move into higher frequencies and wider bandwidths\, small measurement errors can lead to costly design decisions. Engineers working in wireless\, radar\, satellite\, and optical domains must now validate signals that push existing tools to their limits. \nJoin Jun Chie\, Vice President of Product Management at Keysight\, to explore where measurement fidelity begins to break down\, and how engineers are adapting. You’ll see how next-generation instrumentation helps improve signal accuracy\, reduce uncertainty\, and increase confidence in design decisions. \nREGISTER HERE
URL:https://semiwiki.com/event/webinar-how-frequency-ranges-expanded-and-why-measurement-fidelity-became-critical/
LOCATION:Online
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DTSTART;TZID=America/Los_Angeles:20260522T100000
DTEND;TZID=America/Los_Angeles:20260522T110000
DTSTAMP:20260608T195502
CREATED:20260414T063003Z
LAST-MODIFIED:20260414T063003Z
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SUMMARY:Webinar: How System Scale Expanded\, and Why Network Traffic Validation Became Essential
DESCRIPTION:AI data center networks now operate at a scale where device-level validation no longer reflects real performance. Engineers must understand how systems behave under realistic traffic conditions\, not just in isolated tests. \nJoin Ram Periakaruppan\, vice president and general manager of network applications and security at Keysight\, to learn how large-scale traffic emulation reveals congestion\, latency issues\, and performance limits. You’ll see how to validate AI infrastructure under real workloads and ensure it performs reliably at scale. \nREGISTER HERE
URL:https://semiwiki.com/event/webinar-how-system-scale-expanded-and-why-network-traffic-validation-became-essential/
LOCATION:Online
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DTSTART;TZID=America/Los_Angeles:20260528T100000
DTEND;TZID=America/Los_Angeles:20260528T110000
DTSTAMP:20260608T195502
CREATED:20260425T081459Z
LAST-MODIFIED:20260425T081459Z
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SUMMARY:Webinar: Cutting Full-Chip SoC Debug from Days to Minutes with AI
DESCRIPTION:*Company Email Required for Registration* \nFull-chip SoC debug has become one of the most expensive bottlenecks in modern verification. A single production issue can pull multiple engineers away days as they chase a failure through waveforms\, logs\, and across hundreds of thousands of lines of code. \nIn this webinar\, we will demonstrate how the Bronco AI Debug Agent performs root-cause analysis (RCA) on real production issues in under 15 minutes\, with a 70% success rate on customer regressions. You will see the agent operate end-to-end on a representative full-chip SoC\, from a failing regression to an annotated root cause\, while interoperating with customer’s standard commercial EDA flows. \nWhat we will cover: \n– Live demonstration of the Debug Agent on a full-chip SoC regression failure\n– How the agent navigates massive codebases\, logs\, and waveforms to isolate failure mechanisms\n– Deployment patterns at large public chip companies and as well as fast-moving startups\n– How bring-your-own-model and on-prem deployment keep customer IP inside your environment.\n– How Bronco gets better without ever training on customer data. \nWho should attend: \n– DV engineers and managers responsible for regression triage and production debug\n– SoC verification leads evaluating AI-native tooling for their flows\n– VPs of Engineering and Silicon leaders tracking DV cycle time and engineering ROI\n– Security and infrastructure owners assessing on-prem AI deployment for chip design \nSpeaker: \nDavid Zhi LuoZhang\, Co-Founder and CEO of Bronco AI\, will walk through the live demonstration on a real design and take questions how customers deploy\, evaluate\, and scale Bronco within their silicon projects. David works tightly with customers to deploy Bronco and coordinates between the core R&D\, customer\, and industry-relations teams at Bronco. \n*This webinar is in partnership with SemiWiki and Bronco AI* \nREGISTER HERE
URL:https://semiwiki.com/event/webinar-cutting-full-chip-soc-debug-from-days-to-minutes-with-ai/
LOCATION:Online
ATTACH;FMTTYPE=image/png:https://semiwiki.com/wp-content/uploads/2026/04/Screenshot-2026-04-25-011434.png
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DTSTART;TZID=America/Los_Angeles:20260529T100000
DTEND;TZID=America/Los_Angeles:20260529T110000
DTSTAMP:20260608T195502
CREATED:20260414T063056Z
LAST-MODIFIED:20260414T063056Z
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SUMMARY:Webinar: How Manufacturing Complexity Increased\, and Why Validation Had to Evolve
DESCRIPTION:As semiconductor complexity increases and board designs become denser\, manufacturing teams face tighter tolerances\, reduced test access\, and rising pressure to maintain yield and throughput. Validating RF performance and high-speed digital signal integrity at production scale adds a new layer of complexity that traditional approaches struggle to address. \nJoin Jason Kary\, Senior Vice President and President of Keysight’s Electronic Industrial Solutions Group\, to explore how manufacturing validation is evolving. You’ll learn how wafer-level and in-circuit test strategies improve coverage\, detect defects earlier\, and enable consistent\, high-volume production at scale without compromising quality. \nREGISTER HERE
URL:https://semiwiki.com/event/webinar-how-manufacturing-complexity-increased-and-why-validation-had-to-evolve/
LOCATION:Online
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