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DTSTART;VALUE=DATE:20260819
DTEND;VALUE=DATE:20260822
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SUMMARY:IEEE Hot Interconnects Symposium 2026
DESCRIPTION:Welcome to the 33rd iteration of the IEEE Hot Interconnects symposium. HotI’2026 will be held virtually. \n2026 Conference Theme\nScale-Up\, Scale-Out\, Scale-Across: Do they really differ? \nComplex high-capacity training and disaggregated inference workloads are being scaled-across multiple sites\, blurring the lines between contemporary scale-out and scale-up interconnection stacks. All the classical issues\, such as jitter\, bursts\, flow/congestion\, long-tail latencies\, etc.\, are amplified over long distances\, requiring deliberate interventions across the full interconnection stack: algorithms\, operational tools\, communication frameworks\, and network fabrics. This edition of Hot Interconnects will explore these interventions behind operationalizing interconnects over long\, short\, and shorter distances. \nHotI33 (2026) Overview\nIEEE Hot Interconnects is the premier international forum for researchers and developers of state of the art hardware and software architectures and implementations for interconnection networks of all scales\, ranging from multi-core on-chip interconnects to those within systems\, clusters\, and data centers. Leaders in industry and academia attend the conference to interact with individuals at the forefront of this field. \nOur objective is to address the data center networking and the supercomputing communities. We hope you can join us and benefit not only by the content but also by the prime networking opportunities this event always offers. \nREGISTER HERE
URL:https://semiwiki.com/event/ieee-hot-interconnects-symposium-2026/
LOCATION:Online
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DTSTART;TZID=America/Los_Angeles:20260820T100000
DTEND;TZID=America/Los_Angeles:20260820T120000
DTSTAMP:20260812T022156Z
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SUMMARY:Webinar: Mastering Layout Parasitics: Faster Analysis\, Optimization and Debug with ParagonX
DESCRIPTION:Discover Synopsys ParagonX\, a powerful tool for intelligent analysis\, debugging\, simulation and visualization of IC layout parasitics. This webinar demonstrates how ParagonX accelerates root-cause analysis for top-level analog\, custom digital and mixed-signal designs. \nWhat You Will Learn: \n\nAssess and quantify the effects of layout parasitics early in the design process.\nImprove productivity with rapid iterations that guide layout optimization.\nSeamlessly integrate ParagonX into your analog and custom design workflow.\n\nSpeakers: \n\nKopal Kulshreshtha\nPrincipal Product Manager\, Synopsys\nRob Dohanyos\nPrincipal Product Specialist\, Synopsys\n\nREGISTER HERE
URL:https://semiwiki.com/event/webinar-mastering-layout-parasitics-faster-analysis-optimization-and-debug-with-paragonx/
LOCATION:Online
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DTSTART;TZID=America/Los_Angeles:20260820T100000
DTEND;TZID=America/Los_Angeles:20260820T170000
DTSTAMP:20260804T024422Z
CREATED:20260804T024422Z
LAST-MODIFIED:20260804T024422Z
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SUMMARY:RF Summer Camp - Woburn
DESCRIPTION:About this event\nRF Summer Camp 2026 Comes to Woburn\, MA!  \nJoin us for a hands-on technical workshop where RF learning meets the spirit of summer camp. Through expert-led sessions\, live demos\, guided activities\, and plenty of free play\, you’ll refresh RF fundamentals\, sharpen practical measurement skills\, and explore the latest RF technologies in a fun\, relaxed setting. \nFrom RF measurements\, validation\, and signal generation to VNA fundamentals\, phase noise\, and spur searching with a handheld spectrum analyzer during an interactive FieldFox hunt\, you’ll gain practical skills\, fresh insights\, and new connections\, with lunch and dessert included. \nPack your gear. It’s going to be wicked smart! \n\n\n\n\n\n\nWho should attend this event?\nThis event is ideal for RF engineers seeking to expand their hands-on knowledge of RF testing and measurement techniques. \n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/rf-summer-camp-woburn/
LOCATION:Woburn\, MA\, Woburn\, MA\, Woburn\, MA\, United States
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DTSTART;TZID=America/Los_Angeles:20260820T110000
DTEND;TZID=America/Los_Angeles:20260820T120000
DTSTAMP:20260804T024244Z
CREATED:20260804T024244Z
LAST-MODIFIED:20260804T024244Z
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SUMMARY:Webinar: Master Battery Testing: Characterization\, Emulation\, and Lab Infrastructure
DESCRIPTION:About this event\nAs battery-powered systems continue to grow in complexity\, accurate battery characterization\, testing\, and emulation are critical for ensuring performance\, safety\, and reliability. \nIn this webinar\, we will explore advanced battery test and emulation solutions designed for applications ranging from IoT and medical devices to EV and BESS systems. \nTopics include battery cell characterization using EIS for precise aging evaluation and SoH estimation\, key considerations for safe and scalable battery pack testing\, and battery profiling and emulation techniques for accurate battery life calculation and reliable system validation. \n\n\n\n\n\n\nWho should attend this event?\nChemical and electrical engineers that design and evaluate batteries. Any electronic solutions designers that rely on batteries to power their devices (eg.: IoT\, power tools\, consumer electronics\, medical devices\, EVs\, BESS) \n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/webinar-master-battery-testing-characterization-emulation-and-lab-infrastructure/
LOCATION:Online
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DTSTART;TZID=America/Los_Angeles:20260820T143000
DTEND;TZID=America/Los_Angeles:20260820T210000
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CREATED:20260804T024920Z
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SUMMARY:Manufacturing Test User Group Meeting (UGM) 2026 - Mexico
DESCRIPTION:About this event\nInnovating to Simplify Your Test Complexity  \nJoin Keysight at Manufacturing Test User Group Meeting (UGM) 2026 | Mexico to discover the latest innovations\, insights\, and strategies for simplifying today’s manufacturing test complexity. Explore advancements in in-circuit\, flashing\, and functional test systems\, data analytics\, automation\, and next-generation manufacturing technologies. \nMore Than Just a Meeting. More Reasons to Join.   \nAt UGM 2026\, you will: \n\nDiscover emerging trends shaping the future of electronics manufacturing test for AI infrastructure and automotive applications.\nLearn strategies to improve quality\, coverage\, and throughput.\nExplore innovations across ICT\, massive parallel flashing\, functional test systems\, AI-driven boundary scan strategies\, and advanced automated test platforms.\nExperience solutions in action through live demonstrations\, including an exclusive NPI showcase of the Central Computing Unit (CCU) Tester.\nConnect with Keysight experts and industry peers to exchange insights and build valuable connections.\n\nRegister today. \n\n\n\n\n\n\nWho should attend this event?\nThis event is designed for manufacturing leaders\, engineers\, and technology professionals looking to stay ahead of evolving electronics manufacturing challenges. Join industry peers exploring new test innovations\, automation strategies\, and next-generation solutions to improve efficiency\, quality\, and production performance. \n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/manufacturing-test-user-group-meeting-ugm-2026-mexico/
LOCATION:Hotel RIU Plaza Guadalajara\, Hotel RIU Plaza Guadalajara\, Av. Adolfo Lopez Mateos Sur 830\, Guadalajara\, Jalisco\, Mexico
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