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DTSTART;VALUE=DATE:20260419
DTEND;VALUE=DATE:20260424
DTSTAMP:20260420T013529
CREATED:20260107T100748Z
LAST-MODIFIED:20260107T100748Z
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SUMMARY:2026 IEEE Custom Integrated Circuits Conference (CICC)
DESCRIPTION:Join us for CICC 2026\, the world’s premier conference devoted to IC development. \n\n\n\n\n\n\nApril 19 – 22\, 2026 Seattle\, WA\, USA \n\n\n\n\n\n\nApril 22 – 23\, 2026 – CHISIC Workshop \nAbout CICC\n\n\nThe IEEE Custom Integrated Circuits Conference is a premier conference devoted to IC development. The conference program is a blend of oral presentations\, exhibits\, panels and forums. The conference sessions present original first published technical work and innovative circuit techniques that tackle practical problems. CICC is the conference to find out how to solve design problems\, improve circuit design techniques\, get exposure to new technology areas\, and network with peers\, authors and industry experts. \nThere are 3 days of Technical Sessions that include lecture presentations addressing state of the art developments in integrated circuit design. The Educational Sessions are a full day of tutorials instructed by recognized invited speakers. The Panels\, and Forums are presented throughout the conference to enrich the learning experience of the attendees. The Panel Discussions and Forums are presented by leaders from the IC industry. CICC includes an Exhibits Hall that is open in the evenings where Semiconductor manufacturers\, software tool suppliers\, silicon IP providers\, design-service houses\, and technical book publishers offer displays and demonstrations of their products. CICC is sponsored by the IEEE Solid-State Circuits Society and technically co-sponsored by the IEEE Circuits and Systems Society. \n\n\n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/2026-ieee-custom-integrated-circuits-conference-cicc/
LOCATION:Seattle\, Washington\, Seattle\, WA\, United States
ATTACH;FMTTYPE=image/png:https://semiwiki.com/wp-content/uploads/2026/01/Screenshot-2026-01-07-020639.png
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DTSTART;VALUE=DATE:20260420
DTEND;VALUE=DATE:20260423
DTSTAMP:20260420T013529
CREATED:20250828T055712Z
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SUMMARY:DATE 2026
DESCRIPTION:Design\, Automation and Test in Europe Conference |\nThe European Event for Electronic System Design & Test\nCall for Papers\n\n\nThe DATE conference is the main European event bringing together designers and design automation users\, researchers and vendors\, as well as specialists in hardware and software design\, test\, and manufacturing of electronic circuits and systems. DATE places a strong emphasis on both technology and systems\, covering ICs/SoCs\, reconfigurable hardware\, and embedded systems\, as well as embedded software. \nThe three-day event consists of a conference with regular papers\, extended abstracts\, and late breaking results\, complemented by timely keynotes\, special days\, focus sessions\, embedded tutorials\, half-day workshops\, and multi-partner project sessions. The event will also host the Young People Programme fostering networking and exchanges of information on relevant issues\, recent research outcomes\, and career opportunities for junior researchers. Poster-supported live interactions and pre-recorded videos are available to complement all research paper presentations before\, during\, and after the conference. \nDATE 2026 is the 29th edition of an event that has always been the place for researchers\, young professionals\, and industrial partners to meet\, present their research\, and discuss current developments and upcoming trends\, with high emphasis on social interaction. \nConference Scope\nThe conference addresses all aspects of research into technologies for electronic and systems engineering. It covers the design process\, test\, and tools for design automation of electronic products\, ranging from integrated circuits to distributed large-scale systems. This domain includes both hardware and embedded software design issues. The conference scope also includes the specification of design requirements and new architectures for challenging application fields such as sustainable computing\, smart societies and digital wellness\, secure systems\, autonomous systems and smart industry\, and state-of-the-art applications of artificial intelligence. Engineers\, scientists\, and researchers involved in innovative industrial designs are particularly encouraged to submit papers to foster feedback ranging from design to research aspects. \nConference Sponsors\nThe event is sponsored by the European Design and Automation Association (EDAA)\, the Electronic System Design Alliance (ESDA)\, the IEEE Council on Electronic Design Automation (IEEE CEDA) and the ACM Special Interest Group on Design Automation (ACM SIGDA). \nIn cooperation with IEEE Computer Society Test Technology Technical Community (TTTC)\, IEEE Solid-State Circuits Society (SSCS) and IEEE Computer Society (IEEE CS). \nConference Committees\nThe conference leverages the support of multiple committees to support its organisation. The DATE Sponsors Committee supervises the overall structure and operations of the conference; the Executive Committee designs and implement the yearly programme of the conference\, and the Technical Programme Committee is dedicated to develop reviews and select the research manuscripts to be published at the conference. \n\nDATE Sponsors Committee (DSC)\nDATE Executive Committee (DEC)\nTechnical Programme Committee (TPC)\n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/date-2026/
LOCATION:Palazzo della Gran Guardia\, Palazzo della Gran Guardia\, Piazza Brà\, Verona\, 37121\, Italy
ATTACH;FMTTYPE=image/png:https://semiwiki.com/wp-content/uploads/2025/08/Screenshot-2025-08-27-225522.png
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DTSTART;VALUE=DATE:20260420
DTEND;VALUE=DATE:20260424
DTSTAMP:20260420T013529
CREATED:20260320T201032Z
LAST-MODIFIED:20260320T201032Z
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SUMMARY:Semiconductor Reliability and Product Qualification
DESCRIPTION:Product reliability and qualification continues to evolve with the electronics industry. New electronics applications require new approaches to reliability and qualification. In the past\, reliability meant discovering\, characterizing and modeling failure mechanisms\, and determining their impact on the reliability of the circuit. Today\, reliability can involve tradeoffs between performance and reliability; assessing the impact of new materials; dealing with limited margins\, and other factors. This requires information on subjects like: statistics\, testing\, technology\, processing\, materials science\, chemistry\, and customer expectations. While customers expect high reliability levels\, incorrect testing\, calculations\, and qualification procedures can severely impact reliability. Semiconductor Reliability and Product Qualification is a 4-day course that offers detailed instruction on a variety of subjects pertaining to semiconductor reliability and qualification. This course is designed for every manager\, engineer\, and technician concerned with reliability in the semiconductor field\, qualifying semiconductor components\, or supplying tools to the industry. \nWhat Will I Learn By Taking This Class?\nParticipants will learn to develop the skills to determine what failure mechanisms might occur\, and how to test for them\, develop models for them\, and eliminate them from the product. This skill building series is divided into four segments: \n\nOverview of Reliability and Statistics. Participants will learn the fundamentals of statistics\, sample sizes\, distributions and their parameters.\nFailure Mechanisms. Participants will learn the nature and manifestation of a variety of failure mechanisms that can occur both at the die and at the package level. These include: time-dependent dielectric breakdown\, hot carrier degradation\, electromigration\, stress-induced voiding\, moisture\, corrosion\, contamination\, thermomechanical effects\, interfacial fatigue\, and others.\nQualification Principles. Participants will learn how test structures can be designed to help test for a particular failure mechanism.\nTest Strategies. Participants will learn about the JEDEC test standards\, how to design screening tests\, and how to perform burn-in testing effectively.\n\nCourse Objectives\n\nThis course will provide participants with an in-depth understanding of the failure mechanisms\, test structures\, equipment\, and testing methods used to achieve today’s high reliability components.\nParticipants will be able to gather data\, determine how best to plot the data and make inferences from that data.\nThis course will identify the major failure mechanisms\, explain how they are observed\, how they are modeled\, and how they are eliminated.\nThis course will offer a variety of video demonstrations of analysis techniques\, so the participants can get an understanding of the types of results they might expect to see with their equipment.\nParticipants will be able to identify the steps and create a basic qualification process for semiconductor devices.\nParticipants will be able to knowledgeably implement screens that are appropriate to assure the reliability of a component.\nParticipants will be able to identify appropriate tools to purchase when starting or expanding a laboratory.\n\nREGISTER HERE
URL:https://semiwiki.com/event/semiconductor-reliability-and-product-qualification/
LOCATION:San Jose\, CA
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ORGANIZER;CN="Semitracks%2C Inc.":MAILTO:info@semitracks.com
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