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DTSTART;VALUE=DATE:20260309
DTEND;VALUE=DATE:20260313
DTSTAMP:20260507T141000
CREATED:20250624T161151Z
LAST-MODIFIED:20250624T161151Z
UID:357528-1773014400-1773359999@semiwiki.com
SUMMARY:Semitracks Course: Semiconductor Reliability and Product Qualification
DESCRIPTION:Product reliability and qualification continues to evolve with the electronics industry. New electronics applications require new approaches to reliability and qualification. In the past\, reliability meant discovering\, characterizing and modeling failure mechanisms\, and determining their impact on the reliability of the circuit. Today\, reliability can involve tradeoffs between performance and reliability; assessing the impact of new materials; dealing with limited margins\, and other factors. This requires information on subjects like: statistics\, testing\, technology\, processing\, materials science\, chemistry\, and customer expectations. While customers expect high reliability levels\, incorrect testing\, calculations\, and qualification procedures can severely impact reliability. Semiconductor Reliability and Product Qualification is a 4-day course that offers detailed instruction on a variety of subjects pertaining to semiconductor reliability and qualification. This course is designed for every manager\, engineer\, and technician concerned with reliability in the semiconductor field\, qualifying semiconductor components\, or supplying tools to the industry. \n\n\nWhat Will I Learn By Taking This Class?\nParticipants will learn to develop the skills to determine what failure mechanisms might occur\, and how to test for them\, develop models for them\, and eliminate them from the product. This skill building series is divided into four segments: \n\nOverview of Reliability and Statistics. Participants will learn the fundamentals of statistics\, sample sizes\, distributions and their parameters.\nFailure Mechanisms. Participants will learn the nature and manifestation of a variety of failure mechanisms that can occur both at the die and at the package level. These include: time-dependent dielectric breakdown\, hot carrier degradation\, electromigration\, stress-induced voiding\, moisture\, corrosion\, contamination\, thermomechanical effects\, interfacial fatigue\, and others.\nQualification Principles. Participants will learn how test structures can be designed to help test for a particular failure mechanism.\nTest Strategies. Participants will learn about the JEDEC test standards\, how to design screening tests\, and how to perform burn-in testing effectively.\n\n\n\n\n\nCourse Objectives\n\nThis course will provide participants with an in-depth understanding of the failure mechanisms\, test structures\, equipment\, and testing methods used to achieve today’s high reliability components.\nParticipants will be able to gather data\, determine how best to plot the data and make inferences from that data.\nThis course will identify the major failure mechanisms\, explain how they are observed\, how they are modeled\, and how they are eliminated.\nThis course will offer a variety of video demonstrations of analysis techniques\, so the participants can get an understanding of the types of results they might expect to see with their equipment.\nParticipants will be able to identify the steps and create a basic qualification process for semiconductor devices.\nParticipants will be able to knowledgeably implement screens that are appropriate to assure the reliability of a component.\nParticipants will be able to identify appropriate tools to purchase when starting or expanding a laboratory.\n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/semitracks-course-semiconductor-reliability-and-product-qualification/
LOCATION:Munich\, Germany\, Munich\, Germany
ATTACH;FMTTYPE=image/png:https://semiwiki.com/wp-content/uploads/2025/06/Screenshot-2025-06-24-085557.png
ORGANIZER;CN="Semitracks%2C Inc.":MAILTO:info@semitracks.com
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BEGIN:VEVENT
DTSTART;VALUE=DATE:20260309
DTEND;VALUE=DATE:20260313
DTSTAMP:20260507T141000
CREATED:20260107T032607Z
LAST-MODIFIED:20260107T032607Z
UID:365322-1773014400-1773359999@semiwiki.com
SUMMARY:GOMACTech 2026
DESCRIPTION:GOMACTech (Government Microcircuit Applications & Critical Technology Conference)\n“Beyond the Noise”\n\n\n\nGOMACTech was established primarily to review developments in microcircuit applications for government systems. Established in 1968\, the conference has focused on advances in systems being developed by the Department of Defense and other government agencies and has been used to announce major government microelectronics initiatives such as VHSIC and MIMIC\, and provides a forum for government reviews. \n\nREGISTER HERE
URL:https://semiwiki.com/event/gomactech-2026/
LOCATION:New Orleans Ernest N. Morial Convention Center\, New Orleans Ernest N. Morial Convention Center\, 900 Convention Center Blvd\, New Orleans\, LA\, 70130\, United States
ATTACH;FMTTYPE=image/png:https://semiwiki.com/wp-content/uploads/2026/01/Screenshot-2026-01-06-192512.png
END:VEVENT
BEGIN:VEVENT
DTSTART;VALUE=DATE:20260310
DTEND;VALUE=DATE:20260313
DTSTAMP:20260507T141000
CREATED:20250828T050840Z
LAST-MODIFIED:20250828T050840Z
UID:361050-1773100800-1773359999@semiwiki.com
SUMMARY:embedded world 2026
DESCRIPTION:Global platform for the embedded community\nThe embedded world Exhibition&Conference provides a global platform and a place to meet for the entire embedded community\, including leading experts\, key players and industry associations. It offers unprecedented insight into the world of embedded systems\, from components and modules to operating systems\, hardware and software design\, M2M communication\, services\, and various issues related to complex system design. \nIts expertise and sharp focus on technologies\, processes and future-oriented products make it unparalleled in international comparisons – and THE must-attend event for developers\, system architects\, product managers and technical management. \n\nThe No. 1 hub for the international embedded community\n\n\n\nAs the global platform and the industry place to meet for the embedded community\, embedded world attracts the top experts\, key players and industry associations from all over the world. \nBecome part of the community and use THE industry platform to network and make valuable business contacts! \n\n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/embedded-world-2026/
LOCATION:Exhibition Centre Nuremberg\, Exhibition Centre Nuremberg\, Messezentrum 1\, Nürnberg\, 90471\, Germany
ATTACH;FMTTYPE=image/jpeg:https://semiwiki.com/wp-content/uploads/2025/08/145-embedded-world-2026.jpg
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BEGIN:VEVENT
DTSTART;VALUE=DATE:20260311
DTEND;VALUE=DATE:20260313
DTSTAMP:20260507T141000
CREATED:20260107T032755Z
LAST-MODIFIED:20260220T191555Z
UID:365327-1773187200-1773359999@semiwiki.com
SUMMARY:SNUG Silicon Valley
DESCRIPTION:For more than three decades\, SNUG Silicon Valley has connected engineers\, designers\, and thought leaders with technical experts to network and share best practices for tackling design and verification challenges using Synopsys technologies. The Call for Content invites you to showcase how you are developing tomorrow’s products today with Synopsys solutions. \nThis year\, in addition to our traditional SNUG program\, we are excited to welcome Ansys users to the March 2026 event\, which will also feature topics aligned with Simulation World as part of our expanding content offerings and growing community. \nREGISTER HERE
URL:https://semiwiki.com/event/snug-silicon-valley/
LOCATION:Santa Clara Convention Center\, Santa Clara Convention Center\, 5001 Great America Pkwy\, Santa Clara\, CA\, United States
ATTACH;FMTTYPE=image/jpeg:https://semiwiki.com/wp-content/uploads/2026/01/400x400-v2.jpg
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DTSTART;TZID=America/Los_Angeles:20260311T080000
DTEND;TZID=America/Los_Angeles:20260311T090000
DTSTAMP:20260507T141000
CREATED:20260309T224642Z
LAST-MODIFIED:20260309T224642Z
UID:367313-1773216000-1773219600@semiwiki.com
SUMMARY:Webinar: Shift-Left Compute Subsystem RTL Sign-Off with Software Aware VIP
DESCRIPTION:Wednesday\, March 11 – 8:00 AM Pacific \nDesign and verification teams consistently tell us that compute subsystems require software bring up much earlier than ever before. They need UEFI and Linux to run in simulation\, they need protocol accuracy from day one\, and they need a predictable path to signoff while integration risks rise every quarter. This struggle has become a shared industry reality. \nIn this session we present a scalable methodology to accelerate the development and verification of Compute Subsystems such as Arm® Neoverse™ V3 Compute Subsystem (CSS)-based designs\, with a shift-left in simulation and signoff using Avery Protocol VIP\, CSS VIP\, Software Aware VIP\, Arm Fast Models and QEMU models. \nThis methodology helps teams reduce integration risks\, shorten turnaround time\, and gain system level confidence long before moving to emulation or prototypes. If you are a design or verification engineer\, a firmware engineer or if you manage a team building next generation compute platforms\, this is an event that will strengthen your technical path forward. \nWhat You Will Learn:  \n\nSoftware Aware Verification IP and applications.\nBlock level / Subsystem Compliance Testing with Software Aware VIP.\nFull CSS HW/FW/SW bring up and UEFI Bootup.\nAdvanced debug of Hardware/Firmware/Software.\n\nWho Should Attend: \n\nVerification Managers and Directors.\nDesign and Verification Engineers.\nFirmware/Software Engineers.\n\nProducts Covered: \n\nAvery Verification IP.\nSoftware Aware VIP.\nSystem VIP (CSS).\n\nSpeakers:\n\n\n\n\n\nLuis E. Rodriguez \nTechnical Product Manager\, Siemens EDA \n\n\n\nLuis E. Rodriguez is a Technical Product Manager at Siemens EDA. \nLuis has 17+ years of experience in SoC and IP functional verification\, specializing in developing market‑leading Verification IP. \nHe has contributed to protocol workgroups including PCIe\, CCIX\, Gen‑Z\, and CXL\, where he helped define CXL 2.0 compliance testing. \nAt Siemens\, he focuses on partnerships and solutions for Software‑Aware VIP and supports cross‑functional integration of Verification IP with Siemens EDA tools and emerging Agentic AI. \nHe holds his master’s degree in computer science from National Taiwan University. \n\n\n\n\n\n\nAmit Tanwar \nSoftware Architect\, Siemens EDA \n\n\n\nAmit Tanwar is a Software Architect at Siemens EDA. \nAmit has 18 years of experience in PCI Express and UVM/SystemVerilog‑based Verification IP development. \nHe specializes in building high‑performance\, scalable\, and software‑aware VIP solutions\, and has contributed to multiple generations of advanced verification architectures across the semiconductor industry. \n\n\n\nREGISTER HERE
URL:https://semiwiki.com/event/webinar-shift-left-compute-subsystem-rtl-sign-off-with-software-aware-vip/
LOCATION:Online
ATTACH;FMTTYPE=image/png:https://semiwiki.com/wp-content/uploads/2026/03/Screenshot-2026-03-09-154557.png
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