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Failure and Yield Analysis
April 20 @ 9:00 AM - April 23 @ 5:00 PM$2,095
Millions of dollars wasted. Lost competitive advantage. Idle manufacturing lines and customer frustrations.
These are the all-too-common consequences of semiconductor failures. In today’s economy, competent failure analysts are vital to solve these problems before their companies suffer the repercussions. However, as circuits grow more and more complicated, engineers can easily find themselves entangled in a semiconductor “labyrinth” — searching for a microscopic failure among millions of transistors. With the wide spectrum of available analysis tools and the ever-decreasing probability of defect discovery, failure analysis can quickly become overwhelming even for the experienced analyst.
The solution: Failure and Yield Analysis, a 4-day course that covers effective analysis tools and presents systematic process flows that simplify defect localization and characterization. By focusing on a “Do it Right the First Time” approach, the class will give you the appropriate methodology to successfully locate and characterize defects to determine the root cause of failure.