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CadenceTECHTALK: Preventing EM Failures in IC Designs with Signoff Analysis

September 20 @ 7:00 AM - 8:00 AM

Date: Tuesday, September 20, 2022

Time: 10:00 – 11:00 (CEST)

Electromigration (EM) impacts design reliability, causing failures over time. That is why it’s important to analyze both the power mesh and signal wires to check that the average, rms, or peak currents will not lead to a permanent failure. Learn how the Cadence Voltus IC Power Integrity Solution can report EM violations and display maps to quickly flag weaknesses in your design. Also see how using the Cadence Celsius Thermal Solver can expand this capability to include thermal effects, and how Cadence Innovus Implementation System automates the prevention process.

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